Multi-Beam Laboratory for Engineering Microscopy (MBLEM)

houses the Tescan LYRA3 XM FIB-SEM instrument.

The machine is now equipped with Oxford Instruments EDS and EBSD detectors.

LYRA3 XM FIB-SEM is capable of carrying out versatile nanoscale materials characterisation tasks.

Our particular strengths are:

(a) Micro ring-core FIB-DIC milling for residual stress analysis in all types of materials

(b) Nano-scale 3D tomography by destructive serial sectioning.

Examples of the results obtained using the above techniques are illustrated in the videos featured on our group

YouTube channel (click here for the link).