Multi-Beam Laboratory for Engineering Microscopy (MBLEM)
houses the Tescan LYRA3 XM FIB-SEM instrument.
The machine is now equipped with Oxford Instruments EDS and EBSD detectors.
LYRA3 XM FIB-SEM is capable of carrying out versatile nanoscale materials characterisation tasks.
Our particular strengths are:
(a) Micro ring-core FIB-DIC milling for residual stress analysis in all types of materials
(b) Nano-scale 3D tomography by destructive serial sectioning.
Examples of the results obtained using the above techniques are illustrated in the videos featured on our group